Quadricmeter

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Dr. Sameen Ahmed Khan (rohelakhan@yahoo.com) (Visiting Card, Pictures and the Biographical-Note)
Assistant Professor of Physics,
Engineering Department
Salalah College of Technology (SCOT)
Post Box No. 608, Postal Code 211
Salalah
Sultanate of Oman.
(See the Teaching Time Tables, College Calendar and the Progress Report)
(Current Time Table: HTML, MS WORD, MS EXCEL, DVI, PS OR/AND PDF Formats)

http://www.oocities.org/rohelakhan/
http://www.imsc.res.in/~jagan/khan-cv.html
http://rohelakhan.googlepages.com/
http://www.sct.edu.om/

Quadricmeter

Abstract:
Quadricmeter is the instrument devised to identify (distinguish) and measure the various parameters (axis, foci, latera recta, directrix, etc.,) completely characterizing the important class of surfaces known as the quadratic surfaces. Quadratic surfaces (also known as quadrics) include a wide range of commonly encountered surfaces including, cone, cylinder, ellipsoid, elliptic cone, elliptic cylinder, elliptic hyperboloid, elliptic paraboloid, hyperbolic cylinder, hyperbolic paraboloid, paraboloid, sphere, and spheroid. Quadricmeter is a generalized form of the conventional spherometer and the lesser known cylindrometer (also known as the “Cylindro-Spherometer”). With a conventional spherometer it was possible only to measure the radii of spherical surfaces. Cylindrometer can measure the radii of curvature of a cylindrical surface in addition to the spherical surface. In both the spherometer and the cylindrometer one assumes the surface to be either spherical or cylindrical respectively. In the case of the quadricmeter, there are no such assumptions.

Sameen Ahmed Khan,
Quadricmeter,
Official Journal of the Patent Office, Issue No. 43/2008, Part-I, pp. 25296 (24 October 2008).
Application No.: 2126/MUM/2008 A, International Classification: B69G1/36,
Controller General of Patents Designs and Trade Marks, Government of India.
http://ipindia.nic.in/ipr/patent/journal_archieve/journal_2008/patent_journal_2008.htm
http://ipindia.nic.in/ipr/patent/journal_archieve/journal_2008/pat_arch_102008/official_journal_24102008_part_i.pdf
http://www.patentoffice.nic.in/, http://www.ipindia.nic.in/.
(patent in process, see the patents: http://www.oocities.org/rohelakhan/patents.html).
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* View the Abstract, listed at the BigPatents India.

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Other Patents: Conicmeter

Controller General of Patents Designs and Trade Marks, Government of India
http://www.patentoffice.nic.in/
http://www.ipindia.nic.in/

Over Twenty-Five Technical Writings
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Over one Hundred Non-Technical Writings (Popular Writings)
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In March 2005, I was appointed as the Regular Correspondent for the International Committee for Future Accelerators (ICFA) Beam Dynamics Panel Newsletters, for the region of Middle East & Africa. ICFA, the International Committee for Future Accelerators, provides a forum to discuss and implement plans for further promoting collaborative accelerator-based science. Its primary purpose is to strengthen collaboration in accelerator-based science, to encourage future projects, and to make recommendations to governments. See the International Committee for Future Accelerators (ICFA) Beam Dynamics Panel Newsletter, No. 36 (April 2005).
http://icfa-usa.jlab.org/archive/newsletter.shtml

MECIT Report (for the stay at the Middle East College of Information Technology)

SCOT Report (for the stay at the Salalah College of Technology)

The Oman Report: The Consolidated Report of my stay in Oman; at the Middle East College of Information Technology (MECIT), Muscat and the Salalah College of Technology (SCOT), Salalah.